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Study of heterostructures of Cu3BiS3-buffer layer measured by Kelvin probe force microscopy measurements (KPFM)1

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dc.creatorMesa, F.spa
dc.creatorFajardo, D.spa
dc.date.accessioned2020-05-26T00:03:46Z
dc.date.available2020-05-26T00:03:46Z
dc.date.created2014spa
dc.description.abstractThe interface formed between Cu3BiS3 thin films and the buffer layer is a potentially limiting factor to the performance of solar cells based on Al/Cu3BiS3/buffer heterojunctions. The buffer layers of ZnS and In2S3 were grown by co-evaporation, and tested as an alternative to the traditional CdS deposited by chemical bath deposition. From the Kelvin probe force microscopy measurements, we found the values of the work function of ZnS, In2S3, and CdS, layers deposited into Cu3BiS3. Additionally, different electronic activity was found for different grain boundaries (GBs), from studies under illumination, we also found the net doping concentration and the density of charged GB states for Cu3BiS3 and Cu 3BiS3/CdS. © 2014 Published by NRC Research Press.eng
dc.format.mimetypeapplication/pdf
dc.identifier.doihttps://doi.org/10.1139/cjp-2013-0592
dc.identifier.issn00084204
dc.identifier.issn12086045
dc.identifier.urihttps://repository.urosario.edu.co/handle/10336/23627
dc.language.isoengspa
dc.publisherNational Research Council of Canadaspa
dc.relation.citationEndPage895
dc.relation.citationIssueNo. 44050
dc.relation.citationStartPage892
dc.relation.citationTitleCanadian Journal of Physics
dc.relation.citationVolumeVol. 92
dc.relation.ispartofCanadian Journal of Physics, ISSN:00084204, 12086045, Vol.92, No.44050 (2014); pp. 892-895spa
dc.relation.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84904323433&doi=10.1139%2fcjp-2013-0592&partnerID=40&md5=092abb764cafeb5e2c9f7ca5bd73bec2spa
dc.rights.accesRightsinfo:eu-repo/semantics/openAccess
dc.rights.accesoAbierto (Texto Completo)spa
dc.source.instnameinstname:Universidad del Rosariospa
dc.source.reponamereponame:Repositorio Institucional EdocURspa
dc.subject.keywordCadmium sulfidespa
dc.subject.keywordGrain boundariesspa
dc.subject.keywordHeterojunctionsspa
dc.subject.keywordOptical waveguidesspa
dc.subject.keywordProbesspa
dc.subject.keywordZinc sulfidespa
dc.subject.keywordCdsspa
dc.subject.keywordChemical-bath depositionspa
dc.subject.keywordCo-evaporationsspa
dc.subject.keywordDoping concentrationspa
dc.subject.keywordElectronic activityspa
dc.subject.keywordKelvin probe force microscopyspa
dc.subject.keywordBuffer layersspa
dc.titleStudy of heterostructures of Cu3BiS3-buffer layer measured by Kelvin probe force microscopy measurements (KPFM)1spa
dc.typeconferenceObjecteng
dc.type.hasVersioninfo:eu-repo/semantics/publishedVersion
dc.type.spaDocumento de conferenciaspa
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